Blank Cover Image
QRコード(所蔵情報)

IEEE annals of the history of computing

フォーマット:
雑誌
責任表示:
Institute of Electrical and Electronics Engineers
言語:
英語
出版情報:
New York, N.Y. : Institute of Electrical and Electronics Engineers
形態:
v
著者名:
Institute of Electrical and Electronics Engineers <DA00739948>  
巻次(年次):
Vol. 14, no. 1 (1992)-
継続前誌:
Annals of the history of computing <AA10425726>
書誌ID:
AA10824528
ISSN:
10586180  CiNii Research  Webcat Plus  JAIRO
子書誌情報
Loading
所蔵情報
Loading availability information
タイトルが類似している資料

類似資料:

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12
 

American Institute of Electrical Engineers

American Institute of Electrical Engineers

Institute of Electrical and Electronics Engineers, American Institute of Electrical Engineers

[American Institute of Electrical Engineers]

Institute of Electrical and Electronics Engineers. Dictionary Subcommittee

Wiley-Interscience

Institute of Electrical and Electronics Engineers

IEEE Quantum Electronics and Applications Society

Institute of Electrical and Electronics Engineers, Jay, Frank, Institute of Electrical and Electronics Engineers. &hellip;

Institute of Electrical and Electronics Engineers

Institute of Electrical and Electronics Engineers

[Institute of Electrical and Electronics Engineers]

IEEE Electrical Insulation Society, Institute of Electrical and Electronics Engineers

Institute of Electrical and Electronics Engineers

Institute of Electrical and Electronics Engineers

[Institute of Electrical and Electronics Engineers]

IEEE Dielectrics and Electrical Insulation Society, Institute of Electrical and Electronics Engineers

Institute of Electrical and Electronics Engineers

Institute of Electrical and Electronics Engineers

[Institute of Electrical and Electronics Engineers]

Institute of Electrical and Electronics Engineers, IEEE Communications Society, IEEE Computer and Vehicular Technology &hellip;

Institute of Electrical and Electronics Engineers

Institute of Electrical and Electronics Engineers

Professional Technical Group on Industrial Electronics